Patent · US Active

Advanced drug development and manufacturing

US10877035B2 · kind B2 · utility

1Cited by
16References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 22, 2015
Grant dateDec 29, 2020
Priority date
Expiry dateJul 14, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2500/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

X-ray fluorescence (XRF) spectrometry has been used for detecting binding events and measuring binding selectivities between chemicals and receptors. XRF may also be used for estimating the therapeutic index of a chemical. For estimating the binding selectivities of a chemical versus chemical analogs, for measuring post translational modification of proteins, and for drug manufacturing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.