Pin-type probes for contacting electronic circuits and methods for making such probes
US10877067B2 · kind B2 · utility
13Cited by
149References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 26, 2018 |
| Grant date | Dec 29, 2020 |
| Priority date | — |
| Expiry date | Feb 5, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07357
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Pin probes and pin probe arrays are provided that allow electric contact to be made with selected electronic circuit components. Some embodiments include one or more compliant pin elements located within a sheath. Some embodiments include pin probes that include locking or latching elements that may be used to fix pin portions of probes into sheaths. Some embodiments provide for fabrication of probes using multi-layer electrochemical fabrication methods.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.