Nano-material imaging detector with an integral pixel border
US10877168B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 15, 2017 |
| Grant date | Dec 29, 2020 |
| Priority date | — |
| Expiry date | Mar 15, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/2928
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A radiation detector array (112) of an imaging system (100) comprises a plurality of detector modules (114). Each of the plurality of detector modules includes a plurality of detector pixel (116). Each of the plurality of detector pixels includes an integral pixel border (202, 204, 206, 208) and a direct conversion active area within the integral pixel border. A method comprises receiving radiation with a nano-material detector pixel that includes an integral pixel border, generating, with the detector pixel, a signal indicative of an energy of the received radiation, while reducing pixel signal crosstalk, and reconstructing the signal to construct an image. An imaging system (100) comprises a source of X-ray radiation configured to emit X-ray radiation that traverses an examination region, a nano-material imaging detector with an integral pixel border, wherein the nano-material imaging detector is configured to detect X-ray radiation, and a reconstructor configured to reconstruct an output of the nano-material imaging detector to produce a CT image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.