Patent · US Active

Time-of-flight depth measurement using modulation frequency adjustment

US10878589B2 · kind B2 · utility

5Cited by

6References

20Claims

0Family size

Assignee

SAMSUNG ELECTRONICS CO., LTD. · KR

Inventors

Gal Bitan · Netanya, IL
Roy Yam · Ramat Gan, IL
Gershi Koltun · Givat Ada, IL

Key dates

Filing date	May 2, 2019
Grant date	Dec 29, 2020
Priority date	—
Expiry date	Jun 26, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30201
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

In a method for time-of-flight (ToF) based measurement, a scene is illuminated using a ToF light source modulated at a first modulation frequency FMOD(1). While the light is modulated using FMOD(1), depths are measured to respective surface points within the scene, where the surface points are represented by a plurality of respective pixels. At least one statistical distribution parameter is computed for the depths. A second modulation frequency FMOD(2) higher than FMOD(1) is determined based on the at least one statistical distribution parameter. The depths are then re-measured using FMOD(2) to achieve a higher depth accuracy.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.