Optical characteristic evaluation method and optical characteristic evaluation system
US10883880B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 15, 2019 |
| Grant date | Jan 5, 2021 |
| Priority date | — |
| Expiry date | Oct 15, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/133536
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical characteristic evaluation method evaluates unevenness of an optical characteristic in an optical film based on analysis of a polarized state of light transmitting through an optical film and an analyzer. The method includes the following, measuring a phase difference and an orientation angle in a plurality of positions; and quantifying and evaluating the unevenness of the optical characteristic based on a parameter of a vector of output light calculated by a formula 1 using a vector showing a polarized state of input light and a matrix showing a polarizing characteristic of the optical film and the analyzer. The formula 1 is as follows, formula 1: F2=M×F1, F1: Stokes vector or Jones vector of input light, F2: Stokes vector or Jones vector of output light, M: Mueller matrix or Jones matrix of the optical film as the evaluation target and the analyzer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.