Non-invasive substance analysis

US10883933B2 · kind B2 · utility

Assignee

• DiaMon Tech AG · DE

Inventors

• Werner Mäntele · Hösbach, DE
• Miguel Angel Pleitez Rafael · Munich, DE
• Tobias Lieblein · Frankfurt, DE
• Otto Hertzberg · Frankfurt am Main, DE
• Alexander Bauer · Rosenheim, DE
• Hermann Von Lilienfeld-Toal · Gelnhausen, DE
• Arne Küderle · Frankfurt am Main, DE
• Tabea Pfuhl · Dieburg, DE

Key dates

• Filing date: Jun 16, 2015
• Grant date: Jan 5, 2021
• Expiry date: Feb 8, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2201/06113
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to analyzing a substance. An optical medium is arrange on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.