Machine vision method and system for monitoring manufacturing processes
US10884401B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 28, 2017 |
| Grant date | Jan 5, 2021 |
| Priority date | — |
| Expiry date | Aug 26, 2037 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method, a computer program product and a machine vision system (30), comprising at least one lighting device (34), at least one image sensor (31 a-c) and a data processing device (32), the system in a first mode illuminating a first object (35) using a first type of illumination and capturing images of the first object at a first image capturing frequency, when the first object (35) is on a second object (33), transmitting the captured image data to the data processing device for analysis, and changing the system for monitoring the second object in a second mode, if absence of the first object on the second object is detected from the image data, wherein said at least one image sensor (31 a-c) is reconfigured to capture images at a second image capturing frequency from the second object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.