System, method, and apparatus for acoustic and magnetic induction thickness inspection of a material on a substrate
US10884423B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 4, 2018 |
| Grant date | Jan 5, 2021 |
| Priority date | — |
| Expiry date | Jun 16, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05D1/0038
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system includes an inspection robot having a plurality of input sensors comprising a plurality of magnetic induction sensors and configured to provide inspection data of an inspection surface, wherein the inspection data comprises electromagnetic (EM) induction data, and wherein the plurality of input sensors are distributed horizontally relative to the inspection surface; wherein at least a portion of the inspection surface comprises a ferrous substrate having a non-ferrous coating thereupon; a controller, comprising: an EM data circuit structured to interpret the EM induction data, and to determine a substrate distance value in response to the EM induction data; and a thickness processing circuit structured to determine a thickness value in response to the EM induction data, the thickness value comprising a thickness of the non-ferrous coating.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.