Inspection device and inspection method for array substrate
US10885821B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 30, 2019 |
| Grant date | Jan 5, 2021 |
| Priority date | — |
| Expiry date | Jul 25, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10K59/80524
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An inspection device includes: a driving circuit, configured to input display data of an image to a pixel electrode of the array substrate; a light-emitting device comprising a first electrode, a second electrode, and a plurality of light-emitting units arranged between the first electrode and the second electrode, and the plurality of light-emitting units is capable of emitting light under the effect of an electric field between the first electrode and the second electrode; a test circuit, configured to electrically connect the first electrode of the light-emitting device to the pixel electrode of the array substrate, and input a first electrical signal to the second electrode of the light-emitting device, to generate the electric field; and a processing circuit, configured to acquire optical information of the light emitted by the light-emitting device, and determine whether there is an electrical defect in the array substrate according to the optical information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.