Semiconductor-product testing device, method for testing semiconductor product, and semiconductor product
US10886001B2 · kind B2 · utility
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12Claims
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Key dates
| Filing date | Mar 22, 2019 |
| Grant date | Jan 5, 2021 |
| Priority date | — |
| Expiry date | Apr 5, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/36
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor-product testing device that supplies a test pattern for testing a semiconductor product to the semiconductor product includes a pattern memory that stores a part of the test pattern. The pattern memory is rewritten during a time when the semiconductor product is tested by a part of the test pattern stored in the pattern memory included in the semiconductor-product testing device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.