Monitoring device under test waveform on signal generator
US10890604B2 · kind B2 · utility
1Cited by
4References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2017 |
| Grant date | Jan 12, 2021 |
| Priority date | — |
| Expiry date | Feb 14, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/2506
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test and measurement instrument having a signal generator circuit and a waveform monitor circuit for monitoring a waveform received at a device under test (DUT). The signal generator circuit generates a waveform based on an input from a user, while the waveform monitor circuit sends captured signals to a processor to determine a waveform received at the DUT. The waveform monitor captures a signal at a first test point and a second test point, via a switch, and the processor receives the captured signals and using linear equations determines both an incident waveform and a reflected waveform from the DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.