Signal source, test system and method for testing a device under test
US10890609B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 15, 2018 |
| Grant date | Jan 12, 2021 |
| Priority date | — |
| Expiry date | Jan 12, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K21/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A signal source is described. The signal source comprises a signal generator, a first frequency divider and a second frequency divider. The first and the second frequency divider are each connected to the signal generator. The signal generator is configured to generate a source signal having a source frequency and to selectively forward the source signal to at least one of the first frequency divider and the second frequency divider. The first frequency divider is established as an integer frequency divider and is configured to generate a first output signal from the source signal. The second frequency divider is different from the first frequency divider and is configured to generate a second output signal from the source signal, wherein a phase noise of the second output signal is considerably lower than a phase noise of the first output signal. Moreover, a test system and a method for testing a device under test are described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.