System and method for RF and jitter testing using a reference device
US10890610B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 3, 2020 |
| Grant date | Jan 12, 2021 |
| Priority date | — |
| Expiry date | Feb 3, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/102
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to some embodiments, a tester tests one or more DUTs by utilizing one or more respective reference devices. The tester comprises one or more test sites and one or more test circuits operatively coupled to each of the test sites. Each test site is configured to: hold a reference device and a DUT, transmit a transmitted electromagnetic RF signal including a test data pattern to the DUT, and receive a received electromagnetic RF signal emitted from the DUT. The test circuits are configured to: receive a first electrical signal converted from the received electromagnetic RF signal, extract first data from the first electrical signal, determine a first error rate between the test data pattern and the first data, and generate a test result on the basis of the first error rate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.