On-chip execution of in-system test utilizing a generalized test image

US10890620B2 · kind B2 · utility

Assignee

• NVIDIA Corporation · US

Inventors

• Milind Sonawane · San Jose, US
• Shantanu Sarangi · Santa Clara, US
• Sailendra Chadalavada · Saratoga, US
• Sumit Raj · Bengaluru, IN
• Rangavajjula Kameswara Naga Mahesh · Narasaraopet, IN
• Jayesh Kumar Pandey · San Jose, US
• Venkat Abilash Reddy Nerallapally · San Jose, US

Key dates

• Filing date: May 17, 2019
• Grant date: Jan 12, 2021
• Expiry date: May 17, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/318566
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Systems and methods enable the updating of tests, test sequences, fault models, and test conditions such as voltage and clock frequencies, over the life cycle of a safety critical application for complex integrated circuits and systems.