Patent · US Active

Automated RFID tag profiling at application

US10892836B2 · kind B2 · utility

0Cited by

3References

20Claims

0Family size

Assignee

AMAZON TECHNOLOGIES, INC. · US

Inventors

Sergey Parshin · Redcliffe, AU
Jon Robert Ducrou · Brisbane, AU
Ryan Hapgood · Brisbane, AU
Jeanette Rogers · Brisbane, AU
Uladzimir Silchanka · Brisbane, AU
Shanmugarajan Muthu Pandian · Brisbane, AU
Matthew Lake · The Gap, AU
Bradley Nathaniel Gray · Brisbane, AU
Yeyang Yu · Calle de la Era, AU

Key dates

Filing date	Jan 9, 2020
Grant date	Jan 12, 2021
Priority date	—
Expiry date	Jan 9, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG06K7/10356
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A system that performs self-diagnosing of unreliable radio frequency identification (RFID) tags in a first location within an environment includes an RFID printer that prints RFID tags in the first location and RFID antennas located at different distances to the first location. The system obtains, for each RFID tag, a first set of RFID parameters of the RFID tag for each RFID antenna when the RFID tag is in the first location. The system generates, for each RFID tag, a model of RFID tag behavior over different distances to an RFID antenna, based at least in part on the first set of RFID parameters obtained for the RFID tag.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.