Multi-wavelength wavefront system and method for measuring diffractive lenses
US10895517B2 · kind B2 · utility
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11References
20Claims
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Key dates
| Filing date | Feb 8, 2019 |
| Grant date | Jan 19, 2021 |
| Priority date | — |
| Expiry date | Feb 8, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/9583
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-wavelength wavefront system and method for measuring diffractive lenses. A system may include one or more light sources configured to emit a plurality of wavelengths of light for diffraction by a diffractive lens. A light sensor may be configured to receive the light that is diffracted by the diffractive intraocular lens. A processor may be configured to determine one or more of the plurality of wavelengths that have a peak diffraction efficiency for the diffractive intraocular lens based on the light received by the light sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.