Patent · US Active

Measuring apparatus for analyzing a measuring medium

US10895526B2 · kind B2 · utility

0Cited by

1References

19Claims

0Family size

Assignee

Endress+Hauser Conducta GmbH+Co. KG · DE

Inventors

Joachim Mannhardt · Aalen, DE
Judith Falk · Echterdingen, DE
Monika Heisterkamp · Ditzingen, DE

Key dates

Filing date	Nov 13, 2018
Grant date	Jan 19, 2021
Priority date	—
Expiry date	Nov 13, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/8528
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present disclosure relates to a measuring apparatus for analyzing a measuring medium. The measuring apparatus includes a probe housing, a radiation source, and coupling and decoupling optics. The optics have a measurement window in the probe housing to direct radiation of the radiation source into a measuring region outside the probe housing and including the measuring medium, and to block measuring radiation from the measuring region. Via the optics, a receiving device detects measuring radiation and generates output data. An additional physical or chemical sensor is integrated into the probe housing and is designed to detect a measurand of the measuring medium and output measurement signals. An electronic measurement unit is configured to collect and process the output data of the receiving device and the measurement signals of the additional physical or chemical sensor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.