Quantitative analysis of signal related measurements for trending and pattern recognition
US10902088B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 17, 2014 |
| Grant date | Jan 26, 2021 |
| Priority date | — |
| Expiry date | Mar 31, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2218/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computerized method for quantitative analysis of signal related measurements, performed with one or more processors, is disclosed. An estimated signature typifying a characteristic feature of the signal related measurements is produced. Multidimensional statistics on the signal related measurements are computed in a multidimensional space with respect to the estimated signature. Matching likelihoods of the signal related measurements are quantified based on distances of the signal related measurements with respect to a shell manifold derived from the multidimensional statistics and enveloping a signature manifold in the multidimensional space. Multidimensional statistics on the estimated signature and trending and pattern recognition are also possible from the signal multidimensional projection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.