Patent · US Active

Laser heterodyne interferometric apparatus and method based on plane mirror reflection

US10907950B1 · kind B1 · utility

1Cited by
4References
3Claims
0Family size

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Key dates

Filing dateFeb 27, 2019
Grant dateFeb 2, 2021
Priority date
Expiry dateFeb 27, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/70
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed are a laser heterodyne interferometric apparatus based on plane mirror reflection and a corresponding method. The interferometric apparatus includes a dual-frequency laser, a first photoelectric receiver, a second photoelectric receiver, a first polarizing beamsplitter, a second polarizing beamsplitter, a third polarizing beamsplitter, a quarter-wave plate, a right angle mirror, an optical compensator, and a measured plane mirror. The method performs heterodyne interferometry with two spatially separated beams of different frequencies and balances the optical path lengths of the measurement beam and the reference beam with the optical compensator. In the method, the measured plane mirror moves back and forth along the propagation direction of the input beams. The disclosure suppresses optical non-linearity and optical thermal drift in laser heterodyne interferometry, simplifies the optical path structure, and improves accuracy of laser heterodyne interferometry.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.