Patterned focal plane arrays of carbon nanotube thin film bolometers with high temperature coefficient of resistance and improved detectivity for infrared imaging
US10908025B2 · kind B2 · utility
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Key dates
| Filing date | Dec 7, 2017 |
| Grant date | Feb 2, 2021 |
| Priority date | — |
| Expiry date | May 14, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2329/0455
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of preparation of focal plane arrays of infrared bolometers includes processing carbon nanotubes to increase a temperature coefficient of resistance (TCR), followed by patterning to form focal plane arrays for infrared imaging.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.