Apparatus for testing an optoelectronic device and method of operating the same
US10908208B2 · kind B2 · utility
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16Claims
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Key dates
| Filing date | Jan 9, 2018 |
| Grant date | Feb 2, 2021 |
| Priority date | — |
| Expiry date | Jan 29, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2863
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Testing apparatus operable to collect optical performance data of optoelectronic devices at different temperatures includes thermal-adjustment devices in thermal and mechanical contact with the optoelectronic devices via optoelectronic device stages. The thermal-adjustment devices can direct thermal energy to the optoelectronic devices under test without heating test targets in close proximity. Consequently, in some instances, spurious results can be avoided and rapid measurement of the optoelectronic devices different temperatures can be achieved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.