Determining two-dimensional image data from at least one sectional surface of an acquisition volume as part of a magnetic resonance imaging process
US10908244B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 29, 2017 |
| Grant date | Feb 2, 2021 |
| Priority date | — |
| Expiry date | May 5, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/5608
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for determining two-dimensional image data from at least one sectional surface of an acquisition volume as part of a magnetic resonance imaging process by a combined apparatus, including a magnetic resonance imaging facility and an X-ray facility, is provided. The method includes controlling the X-ray facility to acquire at least one X-ray image that images at least part of an object. At least one piece of object information is determined by image processing the X-ray image. At least one sectional-surface parameter that defines an arrangement of the sectional surface in the acquisition volume is determined. The magnetic resonance imaging facility is controlled to acquire measurement data relating to the sectional surface. The two-dimensional image data is calculated from the measurement data. The sectional-surface parameter is used as the basis for the control of the magnetic resonance imaging facility and/or for the calculation of the two-dimensional image data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.