Patent · US Active

Method and system for detecting faulty devices

US10908980B2 · kind B2 · utility

1Cited by

2References

20Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Benoit Derat · Munich, DE
Athanasios Karamalis · Munich, DE
Sherif Ahmed · Starnberg, DE

Key dates

Filing date	Nov 20, 2018
Grant date	Feb 2, 2021
Priority date	—
Expiry date	Apr 11, 2039

Classification

Technology area (CPC H)Electricity
CPC primaryH04B5/70
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

A method and a system for detecting faulty devices are provided. The method comprises the steps of gathering test data in near field with respect to a device under test, extrapolating the test data to far field conditions with the aid of at least one machine learning technique, and evaluating a far field performance of the device under test on the basis of the far field conditions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.