Patent · US Active

Calibration pattern for an imaging system

US10909722B2 · kind B2 · utility

0Cited by
3References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 23, 2017
Grant dateFeb 2, 2021
Priority date
Expiry dateJul 29, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30141
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention concerns a calibration target (30) of an optical system, formed of a plate (32) comprising through holes (38).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.