Conducted OTA test fixture
US10910729B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 28, 2020 |
| Grant date | Feb 2, 2021 |
| Priority date | — |
| Expiry date | Jan 28, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01Q1/42
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Systems and methods relating to performing individual transmit and/or receive measurements for each antenna element in an antenna array implemented on an Substrate Integrated Antenna Array (SIAA) are disclosed. In some embodiments, an SIAA comprises a substrate, one or more antenna elements at a surface of the substrate, and an electrically conductive via fence having a first side electrically coupled to ground within the substrate and a second side at the surface of the substrate, the electrically conductive via fence separately circumscribing each antenna element of the one or more antenna elements within the substrate. The SIAA enables the use of a respective test structure to perform per-antenna element measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.