Testing method and testing system
US10914785B2 · kind B2 · utility
0Cited by
11References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 29, 2019 |
| Grant date | Feb 9, 2021 |
| Priority date | — |
| Expiry date | Jul 29, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318558
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure provides a testing method and a testing system. The testing method is performed by at least one processor and includes the following operations: converting a circuit data of a scan test to a program, in which the program is configured to observe an untested part of a circuitry that is unable to be tested in the scan test; generating a waveform data associated with the untested part; generating a look-up table according to the program and a netlist file, in which the netlist file indicates the circuitry; and testing the untested part of the circuitry according to the waveform data and the look-up table.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.