Patent · US Active

Methods and apparatus for sensor having fault trip level setting

US10914797B2 · kind B2 · utility

2Cited by

31References

17Claims

0Family size

Assignee

Allegro MicroSystems, LLC · US

Inventors

Alexander Latham · Harvard, US
Stephen Marshall · Pasadena, US
Aaron Cook · Butte, US

Key dates

Filing date	Sep 11, 2018
Grant date	Feb 9, 2021
Priority date	—
Expiry date	Sep 11, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/0023
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Methods and apparatus for a sensor having non-ratiometric fault trip level setting. In embodiments, a sensor has a sensing element with a fixed gain. A signal processing module receives the fault trip level setting and maintains the fault trip level setting constant during changes in the supply voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.