System level test generation using DNN translation from unit level test
US10915436B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 8, 2018 |
| Grant date | Feb 9, 2021 |
| Priority date | — |
| Expiry date | Dec 11, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3644
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the present systems and methods may provide techniques that may provide unit-level test of an SUT, but which translates the unit-level test into a valid test of the SUT itself. For example, in an embodiment, a computer-implemented method for testing a system, the method may comprise analyzing the system to determine sub-components of the system and inputs to the sub-components, performing dynamic testing of the system and collecting pairs of inputs to the system and inputs to the sub-components, training a machine learning model to translate from inputs to the sub-components to inputs to the system input using the collected pairs of inputs to the system and inputs to the sub-components and performing sub-component level testing and translating the sub-component level testing to system level testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.