Sample analysis system
US10916334B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 28, 2017 |
| Grant date | Feb 9, 2021 |
| Priority date | — |
| Expiry date | Oct 2, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/652
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample analysis system is provided with: a reference substance database including measurement results and component classification information of reference substances obtained by each analysis device on information of each reference substance; a reference substance designation unit; a measurement result collation unit to obtain the commonality of the components, the difference between the physical quantities of the respective components, and the degree of coincidence of the measurement results for each analysis device for the designated reference substance; an integration coincidence degree calculation unit to obtain an integration degree of coincidence; and a judgment unit to judge whether or not the difference between the contents of contained components is within an allowable range and classify the corresponding component based on the component classification information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.