Tool measuring device having independent head tilt and alignment and hybrid pantograph-to-optical inner diameter measurement
US10921115B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 19, 2020 |
| Grant date | Feb 16, 2021 |
| Priority date | — |
| Expiry date | Feb 19, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention teaches a punch and die measurement device which includes a linear array LED micrometer arranged so that the light beams and shadows pass vertically from transmitters to receivers, and further teaches a 1:1 ratio pantograph for transferring measurements from inside of a necker die to outside the die where it may then be measured by the linear array LED micrometers. The invention may include a precision alignment block, captive adjustment screws to adjust tilt plates angle of the linear array measurement carriage and lever arms to reduce motion of the adjustment screws as applied to the tilt plates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.