Voltage testing system
US10921350B2 · kind B2 · utility
Inventor
Key dates
| Filing date | Aug 27, 2018 |
| Grant date | Feb 16, 2021 |
| Priority date | — |
| Expiry date | Jan 23, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/16595
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A voltage testing system. The voltage testing system includes a pair of probes, each having a housing with a first end and a second end, wherein the pair of probes are electrically connected by a wire affixed to the first end of each of the pair of probes. A prong extends from the second end of the pair of probes, wherein a pin extends therethrough. The pin is electrically conductive, such that the pin is in communication with a fuse and a plurality of lights within the housing. The pin can be spring-biased such that a connection is formed between the fuse and the pin when the force is applied to the pin. The fuse can sever the electrical connection when a set current is transmitted through the fuse, such that a user is protected from excessive currents. The plurality of lights illuminate in response to receiving a preset voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.