Method and apparatus for measuring resistance of light emitting diode
US10921357B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 18, 2016 |
| Grant date | Feb 16, 2021 |
| Priority date | — |
| Expiry date | Feb 24, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2001/4252
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are a method and device for measuring the resistance of a light-emitting diode that can measure the resistance value of the light-emitting diode accurately in a non-destructive manner. The disclosed method may include: measuring a first radiative current component of an injected current for the light-emitting diode by using the internal quantum efficiency of the light-emitting diode; generating a second radiative current component by modeling the first radiative current component; and computing a resistance value of the light-emitting diode by using the first and second radiative current components resulting from an applied voltage to the light-emitting diode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.