Programmable scan shift testing
US10921371B2 · kind B2 · utility
3Cited by
4References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 5, 2017 |
| Grant date | Feb 16, 2021 |
| Priority date | — |
| Expiry date | Dec 3, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318558
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosed technology facilitates programmable scan shift testing for a scan chain including at least a first segment of scan-flops connected in series with a second segment of scan-flops. The scan chain includes at least a first multiplexor positioned between the first segment and the second segment that is configured to selectively supply scan input from a test controller to the second segment while preventing the second segment from receiving an output of the first segment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.