Systems and methods for determining at least one artifact calibration coefficient
US10922855B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 29, 2018 |
| Grant date | Feb 16, 2021 |
| Priority date | — |
| Expiry date | Apr 22, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10081
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for determining at least one artifact calibration coefficient is provided. The method may include obtaining preliminary projection values of a first object. The radiation rays may be detected by at least one radiation detector. The method may further include generating a preliminary image of the first object based on the preliminary projection values of the first object and generating calibrated projection values of the first object based on the preliminary image. The method may further include determining a relationship between the preliminary projection values and the calibrated projection values. The method may further include, for each of the at least one radiation detector, determining a location of the radiation detector and determining an artifact calibration coefficient corresponding to the radiation detector based on the relationship between the preliminary projection values and the calibrated projection values and the location of the radiation detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.