Method and device for calibration
US10924729B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 31, 2018 |
| Grant date | Feb 16, 2021 |
| Priority date | — |
| Expiry date | Apr 6, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/41
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a method and a device for calibration applied to the field of image processing. The method includes: acquiring a common two-dimensional image and an infrared image of a calibration object, wherein the calibration object carries a first pattern; calculating coordinates of the first pattern in the common two-dimensional image, acquiring coordinates of the first pattern in a global coordinate system, and calculating intrinsic parameters of a first camera device capturing the common two-dimensional image; and calculating coordinates of the first pattern in the infrared image, acquiring the coordinates of the first pattern in the global coordinate system, and calculating intrinsic parameters of a second camera device capturing the infrared image. The method for calibration is capable of enhancing calibration efficiency by a simple calibration method when calibrating a depth camera device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.