Method and functional architecture for inline repair of defective imaging arrays
US10926357B2 · kind B2 · utility
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2References
19Claims
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Key dates
| Filing date | Apr 12, 2018 |
| Grant date | Feb 23, 2021 |
| Priority date | — |
| Expiry date | Oct 31, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/68
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for improving the performance of an image sensor array includes performing an electrical test on the image sensor array, generating a test image from the electrical test to detect an open circuit in a data line of the image sensor array, performing a laser-weld operation the data line to weld a portion of the data line to ground, re-testing the image sensor array to confirm a successful laser-weld operation, performing a laser-cut on a readout portion of the data line, and re-testing the image sensor array to confirm a successful laser-cut operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.