System and method for the positioning and optical inspection of an object
US10928333B2 · kind B2 · utility
0Cited by
9References
28Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 20, 2017 |
| Grant date | Feb 23, 2021 |
| Priority date | — |
| Expiry date | Nov 30, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/95638
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention concerns a method of optical, inspection of an electronic circuit (Card) including the acquisition of images of the electronic circuit by image sensors (C), the use of the images to determine the offset between the position of the electronic circuit (Card) and an inspection position, and the use of said images in at least another step of the method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.