Averaged reference with fault monitoring
US10928434B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 13, 2019 |
| Grant date | Feb 23, 2021 |
| Priority date | — |
| Expiry date | Feb 13, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2827
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The subject disclosure describes a structure and method that generates the average of two or more reference quantities (e.g., reference voltage potentials) and monitors the integrity of the voltage reference potentials. The subject technology produces a reference with improved accuracy and more accurate monitoring compared to traditional techniques. For example, the subject technology provides for a fault circuit that includes a monitoring circuit, and an averaging circuit configured to receive a plurality of reference signals and to produce an averaged reference signal based on the received plurality of reference signals. In some examples, the monitoring circuit is configured to receive the averaged reference signal from the averaging circuit, compare the averaged reference signal to each of the plurality of reference signals, and generate a fault signal when the averaged reference signal deviates from at least one of the plurality of reference signals by at least a threshold value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.