Suppression of structured image artifacts
US10928955B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 21, 2018 |
| Grant date | Feb 23, 2021 |
| Priority date | — |
| Expiry date | Aug 21, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2203/04104
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Structured noise from various aggressors can be suppressed to improve touch performance. A respective noise characteristic can be determined for each respective group of touch nodes (e.g., row, column) among multiple groups of touch nodes in a masked touch image. The respective noise characteristic can be removed from the corresponding respective group of touch nodes in the touch image. For example, a respective noise characteristic can be determined for each respective row and/or for each respective column in the masked touch image. The respective noise characteristic can be removed from the respective row and/or column in the unmasked touch image. In some examples, the determining and subtracting of the noise characteristic can be repeated iteratively within a window of time and/or until one or more noise criteria are met.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.