Method for reconstructing defect
US10935520B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 2, 2018 |
| Grant date | Mar 2, 2021 |
| Priority date | — |
| Expiry date | Oct 23, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for reconstructing a defect includes: S1, establishing a database of magnetic flux leakage signals of a unit defect and acquiring a magnetic flux leakage signal of the unit defect; S2, acquiring a target magnetic flux leakage signal; S3, initially setting a scaling factor k; S4, constructing a forward model; S5, inputting the k into the forward model and performing forward prediction according to the k to acquire a predicted magnetic flux leakage signal for the defect to be detected; S6, calculating an error between the target magnetic flux leakage signal and the predicted magnetic flux leakage signal, and determining whether the error is smaller than an error threshold ε, if yes, executing S7; otherwise, executing S5 after the k is corrected; and S7, scaling the unit defect according to the k to acquire a final size of the defect to be detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.