Method and apparatus for identifying and reporting faults at an information handling system
US10936460B2 · kind B2 · utility
0Cited by
6References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 19, 2018 |
| Grant date | Mar 2, 2021 |
| Priority date | — |
| Expiry date | Sep 14, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2273
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method includes invoking, by an embedded controller at an information handling system, a test procedure to evaluate functionality of motherboard resources at the information handling system. A result of the test procedure is displayed at a primary display device using a built in self test function incorporated at the primary display device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.