Localized free space tester
US10948528B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 12, 2019 |
| Grant date | Mar 16, 2021 |
| Priority date | — |
| Expiry date | Nov 12, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/21
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for testing radio-frequency antenna elements are disclosed. In one embodiment, the apparatus comprises: a frame having a platform to support an array of radio-frequency (RF) antenna elements of a flat panel antenna having antenna elements; a first antenna to transmit microwave energy to subsets of RF antenna elements of the segment and to receive reflected microwave energy from the subsets of RF antenna elements; a filter between the segment and the first antenna, the filter comprising an opening positioned over each of the subsets of RF antenna elements at different times to expose said each of the subsets of RF antenna elements to microwave energy transmitted by the first antenna; a second antenna to receive microwave energy transmitted though the subsets of RF antenna elements at the different times; a controller coupled to the subsets of RF antenna elements and to provide at least one stimulus or condition to the subsets of RF antenna elements; and an analyzer to provide stimulus to the subsets of RF antenna elements and to measure a characteristic of the array using one or both of the first antenna and second antenna.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.