Patent · US Active

Analysis of patch impact on a running database application

US10949197B1 · kind B1 · utility

2Cited by
10References
20Claims
0Family size

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Inventors

Key dates

Filing dateNov 5, 2019
Grant dateMar 16, 2021
Priority date
Expiry dateNov 5, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F8/427
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method, system and computer program for analysis of patch impact. The method comprises obtaining first data manipulating statement (DMS) from description of a patch to be installed to a database system; extracting first parse tree and first access path of first DMS; obtaining second DMS from an running database application; extracting second parse tree of second DMS; comparing first parse tree with second parse tree and first access path with second access path; and installing the patch to a database system in response to a determination that first parse tree is a subset of second parse tree and first access path is a subset of second access path.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.