Patent · US Active

Defect detection system using finite element optimization and mesh analysis

US10949584B2 · kind B2 · utility

0Cited by

0References

12Claims

0Family size

Assignees

BOARD OF TRUSTEES OF MICHIGAN STATE UNIVERSITY · US
The United States of America as Represented by the Secretary of Army · US

Inventors

S. Ratnajeevan H. Hoole · Okemos, US
Sivamayam Sivasuthan · East Lansing, US
Victor Karthik · East Lansing, US
Paramsothy Jayakumar · Bloomfield Hills, US
Ravi S. Thyagarajan · Novi, US
Lalita Udpa · Okemos, US
Arunasalam Rahunanthan · Centerville, US

Key dates

Filing date	May 20, 2016
Grant date	Mar 16, 2021
Priority date	—
Expiry date	Aug 8, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG06F30/23
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A defect detection system uses dedicated, simultaneously operating finite element optimization and mesh generation. Using an Eddy-current based probe, the system can detect and model surface and sub-surface defects.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.