Imaging or measurement methods and systems
US10955331B2 · kind B2 · utility
2Cited by
24References
27Claims
0Family size
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Key dates
| Filing date | Jun 24, 2013 |
| Grant date | Mar 23, 2021 |
| Priority date | — |
| Expiry date | Nov 4, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1445
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Imaging or measurement methods and systems including methods and systems for finding the three-dimensional orientation and position of multiple dipole-like particles and single molecules, methods and systems for generating helical beams and helical spread functions, and methods and systems for super-resolution and super-localization of dense arrays of emitters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.