Patent · US Active

Imaging or measurement methods and systems

US10955331B2 · kind B2 · utility

2Cited by
24References
27Claims
0Family size

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Key dates

Filing dateJun 24, 2013
Grant dateMar 23, 2021
Priority date
Expiry dateNov 4, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2015/1445
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Imaging or measurement methods and systems including methods and systems for finding the three-dimensional orientation and position of multiple dipole-like particles and single molecules, methods and systems for generating helical beams and helical spread functions, and methods and systems for super-resolution and super-localization of dense arrays of emitters.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.