Artificial intelligence analysis of test strip method, apparatus, and system
US10956810B1 · kind B1 · utility
1Cited by
1References
19Claims
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Key dates
| Filing date | Nov 23, 2020 |
| Grant date | Mar 23, 2021 |
| Priority date | — |
| Expiry date | Nov 23, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/088
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, apparatus, and system to determine a result of a diagnostic test strip comprising a machine learning transformer architecture which parallel processes input.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.