Assessment system
US10956869B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2014 |
| Grant date | Mar 23, 2021 |
| Priority date | — |
| Expiry date | May 16, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/105
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
An assessment system, including methods of and apparatus for producing a targeted assessment scheme comprising battery of tests or assessments and based on a plurality of requirements. Methods described include a method of producing an assessment scheme for assessing the suitability of a candidate, the method comprising: receiving as input from a user at least one candidate requirement and at least one candidate test identifier; constructing a candidate assessment comprising at least one test in dependence on the test identifier; analysing the candidate assessment in dependence on the requirement to predict the accuracy of the assessment in identifying a suitable candidate; and reporting on the predicted accuracy of the candidate assessment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.