Patent · US Active

Interconnect bump structures for photo detectors

US10957733B2 · kind B2 · utility

2Cited by
1References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 16, 2020
Grant dateMar 23, 2021
Priority date
Expiry dateJun 16, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3511
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of assembling a photodetector assembly includes depositing bumps on a read out integrated circuit (ROIC) without depositing bumps on a photodiode array (PDA). The method includes assembling the PDA and ROIC together wherein each bump electrically interconnects the ROIC with a respective contact of the PDA. A photodetector assembly includes a PDA. A ROIC is assembled to the PDA, wherein the ROIC is electrically interconnected with the PDA through a plurality of electrically conductive bumps. Each bump is confined within a respective pocket between the ROIC and a respective contact of the PDA. The disclosed methods can enable focal plane array manufacturers to achieve low-cost production of ultra-fine pitch, large format imaging arrays.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.