Patent · US Active

Machine geometry monitoring

US10962361B2 · kind B2 · utility

3Cited by
6References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 26, 2018
Grant dateMar 30, 2021
Priority date
Expiry dateJun 23, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V2201/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A machine state monitoring system for recurrently determining a change in static or dynamic properties of a geometry of a machine with positional encoders to derive a coordinate information of at least a first machine portion with respect to a second machine portion, which are movable with respect to one another. The monitoring system includes one calibration-monitoring-unit with an optical, at least two-dimensional measuring location sensing unit which is fixed to the first machine portion and configured to optically sense an at least two dimensional location information of an artifact which is provided at the second machine portion, and temporarily moved into a sensing range for determining the change in the static or dynamic properties of the geometry of the machine by a comparison of multiple of such sensings, the compensation parameters are then updated and is used to derive the coordinate information from the encoders.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.