Freeform surface imaging spectrometer system
US10962413B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jan 14, 2019 |
| Grant date | Mar 30, 2021 |
| Priority date | — |
| Expiry date | Jun 19, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/1847
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A freeform surface imaging spectrometer system including a primary mirror, a secondary mirror, a tertiary mirror, and a detector is provided. The secondary mirror is a grating having a freeform surface shape, and the grating having the freeform surface shape is obtained by intersecting a set of equally spaced parallel planes with a freeform surface. A plurality of feature rays exiting from a light source is successively reflected by the primary mirror, the secondary mirror and the tertiary mirror to form an image on an image sensor. A reflective surface of each of the primary mirror, the tertiary mirror surface and the tertiary mirror is an xy polynomial freeform surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.